Documente Tehnice (Imaginile sunt cu titlu informativ. Va rugam sa consultati specificatiile tehnice.)
Specificatii
Marca
MicrochipProduct Type
Microcontroller Development Tool
Clasificare
Development Board
Kit Name
SAM E51 Curiosity Nano Evaluation Kit
Tehnologie
MCU
Device Core
ARM Cortex M4F
Processor Family Name
SAME51
Processor Type
MCU
Standards/Approvals
RoHS
Detalii Produs
The Microchip SAM E51 Curiosity Nano Evaluation Kit is a hardware platform to evaluate the SAME51J20A microcontroller (MCU). It is supported by the MPLAB® X Integrated Development Environment (IDE) and MPLAB Harmony v3 software development framework. The evaluation kit provides easy access to the features of the SAM E51 MCU to integrate the device into a custom design. Because the evaluation kit contains an On-Board Nano Debugger for programming and debugging, no external tools are necessary to program the SAME51J20A device.
Informatii despre stoc temporar indisponibile
€ 10,53
€ 10,53 Buc. (fara TVA)
€ 12,74
€ 12,74 Buc. (cu TVA)
1
€ 10,53
€ 10,53 Buc. (fara TVA)
€ 12,74
€ 12,74 Buc. (cu TVA)
Informatii despre stoc temporar indisponibile
1
Documente Tehnice (Imaginile sunt cu titlu informativ. Va rugam sa consultati specificatiile tehnice.)
Specificatii
Marca
MicrochipProduct Type
Microcontroller Development Tool
Clasificare
Development Board
Kit Name
SAM E51 Curiosity Nano Evaluation Kit
Tehnologie
MCU
Device Core
ARM Cortex M4F
Processor Family Name
SAME51
Processor Type
MCU
Standards/Approvals
RoHS
Detalii Produs
The Microchip SAM E51 Curiosity Nano Evaluation Kit is a hardware platform to evaluate the SAME51J20A microcontroller (MCU). It is supported by the MPLAB® X Integrated Development Environment (IDE) and MPLAB Harmony v3 software development framework. The evaluation kit provides easy access to the features of the SAM E51 MCU to integrate the device into a custom design. Because the evaluation kit contains an On-Board Nano Debugger for programming and debugging, no external tools are necessary to program the SAME51J20A device.
