Documente tehnice
Specificatii
Marca
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Montare
Surface Mount
Tip pachet
TSSOP
Numar pini
48
Dimensiuni
12.6 x 6.2 x 1.05mm
Lungime
12.6mm
Latime
6.2mm
Inaltime
1.05mm
Maximum Operating Supply Voltage
3.6 V
Temperatura maxima de lucru
+85 °C
Minimum Operating Supply Voltage
3 V
Frecventa minima de auto-rezonanta
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Temperatura de lucru
-40 → +85 °C
Detalii produs
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
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Documente tehnice
Specificatii
Marca
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Montare
Surface Mount
Tip pachet
TSSOP
Numar pini
48
Dimensiuni
12.6 x 6.2 x 1.05mm
Lungime
12.6mm
Latime
6.2mm
Inaltime
1.05mm
Maximum Operating Supply Voltage
3.6 V
Temperatura maxima de lucru
+85 °C
Minimum Operating Supply Voltage
3 V
Frecventa minima de auto-rezonanta
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Temperatura de lucru
-40 → +85 °C
Detalii produs
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.