Documente tehnice (Imaginile sunt cu titlu informativ. Va rugam sa consultati specificatiile tehnice.)
Specificatii
Marca
NexperiaDirection Type
Uni-Directional
Diode Configuration
Complex Array
Minimum Breakdown Voltage
6V
Tip montare
Surface Mount
Tip pachet
SOT-891
Maximum Reverse Stand-off Voltage
5.5V
Numar pini
6
ESD protection
Yes
Number of Elements per Chip
2
Frecventa minima de auto-rezonanta
-40 °C
Temperatura maxima de lucru
+85 °C
Dimensiuni
1.05 x 1.05 x 0.46mm
Maximum Reverse Leakage Current
100nA
Lungime
1.05mm
Inaltime
0.46mm
Latime
1.05mm
Detalii produs
PRTR5V0U Series, Ultra Low Capacitance Rail-to-Rail ESD Protection Diodes, Nexperia
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.
Transient Voltage Suppressors, Nexperia
Informatii despre stoc temporar indisponibile
P.O.A.
Buc. (Intr-un pachet de 20) (fara TVA)
20
P.O.A.
Buc. (Intr-un pachet de 20) (fara TVA)
Informatii despre stoc temporar indisponibile
20
Documente tehnice (Imaginile sunt cu titlu informativ. Va rugam sa consultati specificatiile tehnice.)
Specificatii
Marca
NexperiaDirection Type
Uni-Directional
Diode Configuration
Complex Array
Minimum Breakdown Voltage
6V
Tip montare
Surface Mount
Tip pachet
SOT-891
Maximum Reverse Stand-off Voltage
5.5V
Numar pini
6
ESD protection
Yes
Number of Elements per Chip
2
Frecventa minima de auto-rezonanta
-40 °C
Temperatura maxima de lucru
+85 °C
Dimensiuni
1.05 x 1.05 x 0.46mm
Maximum Reverse Leakage Current
100nA
Lungime
1.05mm
Inaltime
0.46mm
Latime
1.05mm
Detalii produs
PRTR5V0U Series, Ultra Low Capacitance Rail-to-Rail ESD Protection Diodes, Nexperia
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.


