Documente tehnice
Specificatii
Marca
OSI OptoelectronicsSpectrums Detected
Infrared
Lungimea de unda a sensibilitatii de varf
800nm
Tip pachet
TO-52
Timp montare
Through Hole
Amplifier Function
No
Number of Pins
3
Diode Material
Si
Minimum Wavelength Detected
600nm
Inaltime
3.25mm
Diametru
5.4mm
Peak Photo Sensitivity
50A/W
Polarity
Reverse
Tara de origine
United States
Detalii produs
OSI APD Series 8-150 Silicon Avalanche Photodiodes
The APD series 8-150, from OSI Optoelectronics, are a family of silicon avalanche photodiodes, optimised for operation with 800nm wavelengths. They come in hermetic metal packages with 0.2, 0.5, 1 or 1.5mm active area diameter options. The APD series 8-150 photodiodes offer low noise and high sensitivity over bandwidths up to 1GHz. Suitable applications for the APD 8-150 photodiodes include; optical fibre communication, laser range finder and high speed photometry.
Photodiodes, OSI Optoelectronics
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Incercati din nou mai tarziu
€ 128,20
Buc. (Intr-o cutie de 5) (fara TVA)
€ 152,558
Buc. (Intr-o cutie de 5) (cu TVA)
5
€ 128,20
Buc. (Intr-o cutie de 5) (fara TVA)
€ 152,558
Buc. (Intr-o cutie de 5) (cu TVA)
5
Documente tehnice
Specificatii
Marca
OSI OptoelectronicsSpectrums Detected
Infrared
Lungimea de unda a sensibilitatii de varf
800nm
Tip pachet
TO-52
Timp montare
Through Hole
Amplifier Function
No
Number of Pins
3
Diode Material
Si
Minimum Wavelength Detected
600nm
Inaltime
3.25mm
Diametru
5.4mm
Peak Photo Sensitivity
50A/W
Polarity
Reverse
Tara de origine
United States
Detalii produs
OSI APD Series 8-150 Silicon Avalanche Photodiodes
The APD series 8-150, from OSI Optoelectronics, are a family of silicon avalanche photodiodes, optimised for operation with 800nm wavelengths. They come in hermetic metal packages with 0.2, 0.5, 1 or 1.5mm active area diameter options. The APD series 8-150 photodiodes offer low noise and high sensitivity over bandwidths up to 1GHz. Suitable applications for the APD 8-150 photodiodes include; optical fibre communication, laser range finder and high speed photometry.